V Nagarajan
Publications
Viewing 25 of 54 publications
2002
Nanoscale phenomena in ferroelectric thin films." Integrated Ferroelectrics. Vol. 42. 2002. 173–189.
, , , and . "Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films." Journal of Applied Physics 92 (2002) 6762–6767.
, , , , , and . "Realizing intrinsic piezoresponse in epitaxial submicron lead zirconate titanate capacitors on Si." Applied Physics Letters 81 (2002) 4215–4217.
, , , , , , , , , , , and . "Epitaxial La-doped SrTiO3 on silicon: A conductive template for epitaxial ferroelectrics on silicon." Applied Physics Letters 80 (2002) 4801–4803.
, , , , , , , , , , , and . "Low-temperature integration of lead-based ferroelectric capacitors on Si with diffusion barrier layer." Applied Physics Letters 80 (2002) 3599–3601.
, , , , , , , , and . "Depolarizing-field-mediated 180° switching in ferroelectric thin films with 90° domains." Applied Physics Letters 80 (2002) 1424–1426.
, , , , , , , and . "Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films." Journal of Applied Physics 91 (2002) 1477–1481.
, , , , , , , , , and . "Nanoscale phenomena in synthetic functional oxide heterostructures." Microscopy and Microanalysis 8 (2002) 333–349.
, , , , and . "Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films." Physical Review B - Condensed Matter and Materials Physics 65 (2002) 1–7.
, , , , , , , and . "Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films." Physical Review B - Condensed Matter and Materials Physics 65 (2002) 141011–141017.
, , , , , , , and . "2001
Near field optical second harmonic imaging of the polydomain structure of epitaxial PbZrxTi1-xO3 thin films." Materials Research Society Symposium - Proceedings. Vol. 655. 2001. XLXXVII-XLXXVIII.
, , , , , and . "Nanoscale electromechanical phenomena in ferroelectric thin films." Materials Research Society Symposium - Proceedings. Vol. 655. 2001. XVI-XVII.
, , , , , , and . "Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope." Applied Physics Letters 79 (2001) 3678–3680.
, , , , , , , , , , and . "Control of domain structure of epitaxial PbZr0.2Ti0.8O3 thin films grown on vicinal (001) SrTiO3 substrates." Applied Physics Letters 79 (2001) 2805–2807.
, , , , , , and . "Near-field second harmonic imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1-xO3 thin films." Journal of Microscopy 202 (2001) 250–254.
, , , , , and . "Oxide electrodes for buried-channel field effect transistors." Materials Research Society Symposium - Proceedings 666 (2001) F541-F546.
, , , , and . "Three-domain architecture of stress-free epitaxial ferroelectric films." Journal of Applied Physics 89 (2001) 553–556.
, , , , and . "Direct observation of domain dynamics in lead zirconate titanate thin films." Integrated Ferroelectrics 32 (2001) 199–208.
, , , , , , , , , and . "Cellular domain architecture of stress-free epitaxial ferroelectric films." Materials Research Society Symposium - Proceedings. Vol. 655. 2001. XLXXV-XLXXVI.
, , , , and . "2000
Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 505–510.
, , , , , , , and . "Domain nucleation and relaxation kinetics in ferroelectric thin films." Applied Physics Letters 77 (2000) 3275–3277.
, , , , , and . "Role of substrate on the dielectric and piezoelectric behavior of epitaxial lead magnesium niobate-lead titanate relaxor thin films." Applied Physics Letters 77 (2000) 438–440.
, , , , , , , and . "Role of 90° domains in lead zirconate titanate thin films." Applied Physics Letters 77 (2000) 292–294.
, , , , , , , , and . "Measurement of internal stresses via the polarization in epitaxial ferroelectric films." Physical Review Letters 85 (2000) 190–193.
, , , , , , and . "Analysis of thin PZT films as a function of depth and thickness by GIXS." Integrated Ferroelectrics 29 (2000) 127–141.
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