@article{33763,
  keywords = {Thin films, Electrodes, Substrates, Internal stresses, Elasticity, Polarization, Epitaxial growth, Permittivity, Dielectric susceptibility, Ferroelectric devices, Ferroelectric films, Differential equations, Free energy, Elastic strain tensor},
  author = {A.L Roytburd and S.P Alpay and V Nagarajan and C.S Ganpule and S Aggarwal and E.D Williams and Ramamoorthy Ramesh},
  title = {Measurement of internal stresses via the polarization in epitaxial ferroelectric films},
  abstract = {A study was carried out with the aim of formulating an approach to determine internal stresses in the constrained ferroelectric (FE) films using its electrical and electromechanical characteristics. As a first step, an attempt was made to clarify the theoretical background for electromechanical properties of constrained FE films. Following this, available experimental work was analyzed from this point of view. Overall, it was confirmed that the mechanical characteristics of the films can be determined through the electric response of constrained films.},
  year = {2000},
  journal = {Physical Review Letters},
  volume = {85},
  number = {1},
  pages = {190-193},
  publisher = {American Inst of Physics, Woodbury, NY, United States},
  issn = {00319007},
  doi = {10.1103/PhysRevLett.85.190},
  note = {cited By 118},
  language = {eng},
}