Measurement of internal stresses via the polarization in epitaxial ferroelectric films

Publication Type
Journal Article
Authors
DOI
10.1103/PhysRevLett.85.190
Abstract
A study was carried out with the aim of formulating an approach to determine internal stresses in the constrained ferroelectric (FE) films using its electrical and electromechanical characteristics. As a first step, an attempt was made to clarify the theoretical background for electromechanical properties of constrained FE films. Following this, available experimental work was analyzed from this point of view. Overall, it was confirmed that the mechanical characteristics of the films can be determined through the electric response of constrained films.
Notes
cited By 118
Journal
Physical Review Letters
Volume
85
Year of Publication
2000
Number
1
Pagination
190-193
Publisher
American Inst of Physics, Woodbury, NY, United States
ISSN Number
00319007
Keywords
Research Areas
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