%0 Journal Article
%K Thin films
%K Electrodes
%K Substrates
%K Internal stresses
%K Elasticity
%K Polarization
%K Epitaxial growth
%K Permittivity
%K Dielectric susceptibility
%K Ferroelectric devices
%K Ferroelectric films
%K Differential equations
%K Free energy
%K Elastic strain tensor
%A A.L Roytburd
%A S.P Alpay
%A V Nagarajan
%A C.S Ganpule
%A S Aggarwal
%A E.D Williams
%A Ramamoorthy Ramesh
%B Physical Review Letters
%D 2000
%G eng
%I American Inst of Physics, Woodbury, NY, United States
%P 190-193
%R 10.1103/PhysRevLett.85.190
%T Measurement of internal stresses via the polarization in epitaxial ferroelectric films
%V 85