@article{33731,
  author = {V Nagarajan and C.S Ganpule and H Li and L Salamanca-Riba and A.L Roytburd and E.D Williams and Ramamoorthy Ramesh},
  title = {Control of domain structure of epitaxial PbZr0.2Ti0.8O3 thin films grown on vicinal (001) SrTiO3 substrates},
  abstract = {We have investigated the polydomain formation in 100-200-nm-thick PbZr0.2Ti0.8O3 epitaxial thin films on vicinally cut (100) oriented SrTiO3 substrates. Our results show that there is a preferential location of the nucleation of the a domains along the step edges of the underlying substrate. By piezo-response microscopy, we show that all a domains have their polarization aligned along the same direction. This result is in contrast to flat substrates where fourfold symmetry of a domains is observed. We observe that the critical thickness for a domain formation is much lower than that for PbZr0.2Ti0.8O3 films grown on flat substrates. We have developed a model based on minimization of elastic energy to describe the effect of localized stresses at step edges on the formation of a domains in the ferroelectric layer. © 2001 American Institute of Physics.},
  year = {2001},
  journal = {Applied Physics Letters},
  volume = {79},
  number = {17},
  pages = {2805-2807},
  issn = {00036951},
  doi = {10.1063/1.1402645},
  note = {cited By 25},
  language = {eng},
}