@article{33737,
  keywords = {Lead, Film, Oxide, Zirconium, Imaging, Atomic force microscopy, Priority journal, X-ray Diffraction, Structure analysis, Scanning near field optical microscopy, Titanium derivative, Comparative study, Conference paper, Optical resolution},
  author = {I.I Smolyaninov and H.Y Liang and C.H Lee and C.C Davis and V Nagarajan and Ramamoorthy Ramesh},
  title = {Near-field second harmonic imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1-xO3 thin films},
  abstract = {Near-field optical second harmonic microscopy has been applied to imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1-xO3 thin films in the 0 < x < 0.4 range. Comparison of the near-field optical images and the results of atomic force microscopy and X-ray diffraction studies show that an optical resolution of the order of 100 nm is achieved. Symmetry properties of the near-field second harmonic signal allow us to obtain good optical contrast between the local second harmonic generation in c- and a-domains. Experimentally measured near-field second harmonic images have been compared with the results of theoretical calculations. Good agreement between theory and experiment is demonstrated.},
  year = {2001},
  journal = {Journal of Microscopy},
  volume = {202},
  number = {1},
  pages = {250-254},
  issn = {00222720},
  doi = {10.1046/j.1365-2818.2001.00885.x},
  note = {cited By 11},
  language = {eng},
}