%0 Journal Article
%A S Tiedke
%A T Schmitz
%A K Prume
%A A Roelofs
%A T Schneller
%A U Kall
%A R Waser
%A C.S Ganpule
%A V Nagarajan
%A A Stanishevsky
%A Ramamoorthy Ramesh
%B Applied Physics Letters
%D 2001
%G eng
%P 3678-3680
%R 10.1063/1.1421638
%T Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope
%V 79