@article{33704,
  keywords = {Lattice constants, Ferroelectric materials, X-ray scattering, Lead compounds, Grain boundaries, Pulsed laser applications, Grazing incident x-ray scattering (GIXS)},
  author = {Y Li and V Nagarajan and S Aggarwal and Ramamoorthy Ramesh and L.G Salamanca-Riba and L.J Martínez-Miranda},
  title = {Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films},
  abstract = {Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.},
  year = {2002},
  journal = {Journal of Applied Physics},
  volume = {92},
  number = {11},
  pages = {6762-6767},
  issn = {00218979},
  doi = {10.1063/1.1513195},
  note = {cited By 16},
  language = {eng},
}