%0 Journal Article
%K lattice constants
%K Ferroelectric materials
%K X ray scattering
%K Lead compounds
%K Grain boundaries
%K Pulsed laser applications
%K Grazing incident x-ray scattering (GIXS)
%A Y Li
%A V Nagarajan
%A S Aggarwal
%A Ramamoorthy Ramesh
%A L.G Salamanca-Riba
%A L.J Martínez-Miranda
%B Journal of Applied Physics
%D 2002
%G eng
%P 6762-6767
%R 10.1063/1.1513195
%T Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films
%V 92
%X Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.