Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films

Publication Type	Journal Article

Authors	Y Li V Nagarajan S Aggarwal Ramamoorthy Ramesh L.G Salamanca-Riba L.J Martínez-Miranda
DOI	10.1063/1.1513195
Abstract	Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.
Notes	cited By 16
Journal	Journal of Applied Physics
Volume	92
Year of Publication	2002
Number	11
Pagination	6762-6767
ISSN Number	00218979
Keywords	Lattice constants Ferroelectric materials X-ray scattering Lead compounds Grain boundaries Pulsed laser applications Grazing incident x-ray scattering (GIXS)
Organizations	No Organization
Research Areas	Ramesh Lab
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