Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films
| Publication Type | Journal Article
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| Authors | |
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| DOI |
10.1063/1.1513195
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| Abstract |
Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.
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| Notes |
cited By 16
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| Journal |
Journal of Applied Physics
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| Volume |
92
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| Year of Publication |
2002
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| Number |
11
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| Pagination |
6762-6767
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| ISSN Number |
00218979
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| Keywords | |
| Research Areas | |
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