Permittivity

Fan, W, B Kabius, J.M Miller, S Saha, J.A Carlisle, O Auciello, R.P.H Chang, and Ramamoorthy Ramesh. "Materials science and integration bases for fabrication of (Ba xSr1-x)TiO3 thin film capacitors with layered Cu-based electrodes." Journal of Applied Physics 94 (2003) 6192–6200.

Matsuura, K, Y Cho, and Ramamoorthy Ramesh. "Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy." Applied Physics Letters 83 (2003) 2650–2652.

Cho, Y, K Matsuura, N Valanoor, and Ramamoorthy Ramesh. "Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy." Ferroelectrics. Vol. 292. 2003. 171–180.

Fan, W, S Saha, J.A Carlisle, O Auciello, R.P.H Chang, and Ramamoorthy Ramesh. "Layered Cu-based electrode for high-dielectric constant oxide thin film-based devices." Applied Physics Letters 82 (2003) 1452–1454.

Li, H, H Zheng, L Salamanca-Riba, Ramamoorthy Ramesh, I Naumov, and K Rabe. "Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates." Applied Physics Letters 81 (2002) 4398–4400.

Van Keuls, F.W, R.R Romanofsky, C.H Mueller, J.D Warner, C.L Canedy, Ramamoorthy Ramesh, and F.A Miranda. "Current status of thin film (Ba,Sr)TiO3 tunable microwave components for RF communications." Integrated Ferroelectrics. Vol. 34. 2001. 1605/165–1616/176.

Subramanyam, G, F.A Miranda, R.R Romanofksy, F.W Van Keuls, C.L Canedy, S Aggarwal, T Venkatesan, and Ramamoorthy Ramesh. "Ferroelectric tunable microstrip Lange coupler for K-band applications." IEEE MTT-S International Microwave Symposium Digest. Vol. 3. 2000. 1363–1366.

Nagarajan, V, S.P Alpay, C.S Ganpule, B Nagaraj, S Aggarwal, A.L Roytburd, E.D Williams, and Ramamoorthy Ramesh. "Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness." Proceedings of the Materials Research Society Symposium -. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 505–510.

Roytburd, A.L, S.P Alpay, V Nagarajan, C.S Ganpule, S Aggarwal, E.D Williams, and Ramamoorthy Ramesh. "Measurement of internal stresses via the polarization in epitaxial ferroelectric films." Physical Review Letters 85 (2000) 190–193.