%0 Journal Article
%K Thin films
%K Domain walls
%K Dielectric materials
%K Permittivity
%K Lead compounds
%K Scanning
%K Microscopic examination
%A K Matsuura
%A Y Cho
%A Ramamoorthy Ramesh
%B Applied Physics Letters
%D 2003
%G eng
%P 2650-2652
%R 10.1063/1.1609252
%T Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy
%V 83
%X The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.