TY - JOUR
KW - Thin films
KW - Annealing
KW - Substrates
KW - Permittivity
KW - Crystals
KW - Barium compounds
KW - Antiphase domain boundaries (ADB)
KW - Magnesia
KW - Ceramic materials
AU - H Li
AU - H Zheng
AU - L Salamanca-Riba
AU - Ramamoorthy Ramesh
AU - I Naumov
AU - K Rabe
AB - The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.
BT - Applied Physics Letters
DO - 10.1063/1.1523632
LA - eng
M1 - 23
N1 - cited By 14
N2 - The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.
PY - 2002
SP - 4398
EP - 4400
T2 - Applied Physics Letters
TI - Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates
VL - 81
SN - 00036951
ER -