@article{33689,
  keywords = {Thin films, Domain walls, Dielectric materials, Permittivity, Lead compounds, Scanning, Microscopic examination},
  author = {K Matsuura and Y Cho and Ramamoorthy Ramesh},
  title = {Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy},
  abstract = {The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.},
  year = {2003},
  journal = {Applied Physics Letters},
  volume = {83},
  number = {13},
  pages = {2650-2652},
  issn = {00036951},
  doi = {10.1063/1.1609252},
  note = {cited By 20},
  language = {eng},
}