Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy

Publication Type	Journal Article

Authors	K Matsuura Y Cho Ramamoorthy Ramesh
DOI	10.1063/1.1609252
Abstract	The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.
Notes	cited By 20
Journal	Applied Physics Letters
Volume	83
Year of Publication	2003
Number	13
Pagination	2650-2652
ISSN Number	00036951
Keywords	Thin films Domain walls Dielectric materials Permittivity Lead compounds Scanning Microscopic examination
Organizations	No Organization
Research Areas	Ramesh Lab
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