TY - JOUR
KW - Thin films
KW - Domain walls
KW - Dielectric materials
KW - Permittivity
KW - Lead compounds
KW - Scanning
KW - Microscopic examination
AU - K Matsuura
AU - Y Cho
AU - Ramamoorthy Ramesh
AB - The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.
BT - Applied Physics Letters
DO - 10.1063/1.1609252
LA - eng
M1 - 13
N1 - cited By 20
N2 - The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.
PY - 2003
SP - 2650
EP - 2652
T2 - Applied Physics Letters
TI - Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy
VL - 83
SN - 00036951
ER -