Interfaces (materials)

Auciello, O, A.M Dhote, Ramamoorthy Ramesh, B.T Liu, S Aggarwal, A.H Mueller, N.A Suvarova, and E.A Irene. "Development of materials integration strategies for electroceramic film-based devices via complementary in situ and ex situ studies of film growth and interface processes." Integrated Ferroelectrics. Vol. 46. 2002. 295–306.

Nagaraj, B, T Wu, S.B Ogale, T Venkatesan, and Ramamoorthy Ramesh. "Interface characterization of all-perovskite oxide field effect heterostructures." Journal of Electroceramics 8 (2002) 233–241.

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Yang, G.Y, J.M Finder, J Wang, Z.L Wang, Z Yu, J Ramdani, R Droopad, K.W Eisenbeiser, and Ramamoorthy Ramesh. "Study of microstructure in SrTiO3/Si by high-resolution transmission electron microscopy." Journal of Materials Research 17 (2002) 204–213.

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Krauss, A.R, O Auciello, A.M Dhote, J Im, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Yuan Gao, and A.H Mueller. "Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties." Integrated Ferroelectrics 32 (2001) 121–131.

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Balke, N, Ramamoorthy Ramesh, and P Yu. "Manipulating Ferroelectrics through Changes in Surface and Interface Properties." ACS Applied Materials and Interfaces 9 (2017) 39736–39746.

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Mueller, C.H, F.W Van Keuls, R.R Romanofsky, F.A Miranda, J.D Warner, C.L Canedy, and Ramamoorthy Ramesh. "Characterization of (Ba0.5Sr0.5)TiO3 thin films for Ku-band phase shifters." Integrated Ferroelectrics 28 (2000) 139–149.

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Biswas, A, C.-H Yang, Ramamoorthy Ramesh, and Y.H Jeong. "Atomically flat single terminated oxide substrate surfaces." Progress in Surface Science 92 (2017) 117–141.

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Auciello, O, A.R Krauss, J Im, A Dhote, D.M Gruen, E.A Irene, Yuan Gao, A.H Mueller, and Ramamoorthy Ramesh. "Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques." Integrated Ferroelectrics 28 (2000) 1–12.

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Lorenz, M, M.S Rao, T Venkatesan, E Fortunato, P Barquinha, R Branquinho, D Salgueiro, R Martins, E Carlos, A Liu, F.K Shan, M Grundmann, H Boschker, J Mukherjee, M Priyadarshini, N Dasgupta, D.J Rogers, F.H Teherani, E.V Sandana, P Bove, K Rietwyk, A Zaban, A Veziridis, A Weidenkaff, M Muralidhar, M Murakami, S Abel, J Fompeyrine, J Zuniga-Perez, Ramamoorthy Ramesh, N.A Spaldin, S Ostanin, V Borisov, I Mertig, V Lazenka, G Srinivasan, W Prellier, M Uchida, M Kawasaki, R Pentcheva, P Gegenwart, Miletto Granozio, J Fontcuberta, and N Pryds. "The 2016 oxide electronic materials and oxide interfaces roadmap." Journal of Physics D: Applied Physics 49 (2016).

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Aggarwal, S, B Nagaraj, I.G Jenkins, H Li, R.P Sharma, L Salamanca-Riba, Ramamoorthy Ramesh, A.M Dhote, A.R Krauss, and O Auciello. "Correlation between oxidation resistance and crystallinity of Ti-Al as a barrier layer for high-density memories." Acta Materialia 48 (2000) 3387–3394.

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