TY - JOUR
KW - Thin films
KW - Lanthanum compounds
KW - Ferroelectricity
KW - Interfaces (materials)
KW - Dislocations (crystals)
KW - Strain
KW - Barium compounds
KW - Crystal microstructure
KW - Phase shifters
KW - Film crystallinity
KW - High resolution X ray diffractometry
KW - Lanthanum strontium oxides
KW - Paraelectric films
AU - C.H Mueller
AU - F.W Van Keuls
AU - R.R Romanofsky
AU - F.A Miranda
AU - J.D Warner
AU - C.L Canedy
AU - Ramamoorthy Ramesh
AB - The microstructural properties of (Ba0.5Sr0.5)TiO3 (BSTO) thin films (300, 700, and 1400 nm thick) deposited on LaAlO3 (LAO) substrates were characterized using high-resolution x-ray diffractometery. Film crystallinity was the parameter that most directly influenced tunability, and we observed that a) the crystalline quality was highest in the thinnest film and progressively degraded with increasing film thickness; and b) strain at the film/substrate interface was completely relieved via dislocation formation. Paraelectric films such as BSTO offer an attractive means of incorporating low-cost phase shifter circuitry into beam-steerable reflectarray antennas. © 2000 OPA (Overseas Publishers Association) N.V. Published by license under the Gordon and Breach Science Publishers imprint.
BT - Integrated Ferroelectrics
DO - 10.1080/10584580008222227
LA - eng
M1 - 1-4
N1 - cited By 7
N2 - The microstructural properties of (Ba0.5Sr0.5)TiO3 (BSTO) thin films (300, 700, and 1400 nm thick) deposited on LaAlO3 (LAO) substrates were characterized using high-resolution x-ray diffractometery. Film crystallinity was the parameter that most directly influenced tunability, and we observed that a) the crystalline quality was highest in the thinnest film and progressively degraded with increasing film thickness; and b) strain at the film/substrate interface was completely relieved via dislocation formation. Paraelectric films such as BSTO offer an attractive means of incorporating low-cost phase shifter circuitry into beam-steerable reflectarray antennas. © 2000 OPA (Overseas Publishers Association) N.V. Published by license under the Gordon and Breach Science Publishers imprint.
PB - Taylor and Francis Inc.
PY - 2000
SP - 139
EP - 149
T2 - Integrated Ferroelectrics
TI - Characterization of (Ba0.5Sr0.5)TiO3 thin films for Ku-band phase shifters
VL - 28
SN - 10584587
ER -