%0 Journal Article
%K Thin films
%K Spectroscopic ellipsometry
%K Film growth
%K Ferroelectric materials
%K Strontium compounds
%K X-ray scattering
%K Heterojunctions
%K Ferroelectric films
%K Interfaces (materials)
%K Surface treatment
%K Electron scattering
%K Barium compounds
%K Ion scattering
%K Recoil spectroscopy
%K Ellipsometry
%K Electron spectroscopy
%A O Auciello
%A A.R Krauss
%A J Im
%A A Dhote
%A D.M Gruen
%A E.A Irene
%A Yuan Gao
%A A.H Mueller
%A Ramamoorthy Ramesh
%B Integrated Ferroelectrics
%D 2000
%G eng
%I Taylor and Francis Inc.
%P 1-12
%R 10.1080/10584580008222216
%T Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques
%V 28