Doping (additives)
, , , , , , and . "Deposition and electrical characterization of dielectric/ferromagnetic heterostructure." Proceedings of the Materials Research Society Symposium -. Ed. , , , , and . Vol. 602. 2000. 363–370.
, , , , , and . "A study of vacancy-related defects in (pb,la)(zr,ti)o3 thin films using positron annihilation." IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 47 (2000) 916–920.
Google Scholar | DOI | BibTeX | Endnote tagged | RIS
, , , , , and . "Formation of the (La0.67Sr0.33)2MnO4 phase in La-Sr-Mn-O thin films by pulsed laser deposition." Journal of Materials Research 15 (2000) 1524–1527.
Google Scholar | DOI | BibTeX | Endnote tagged | RIS
, , , , , and . "Effect of hydrogen anneals on niobium-doped lead zirconate titanate capacitors with lanthanum strontium cobalt oxide/platinum electrodes." Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 38 (1999) 5361–5363.
, , , , , , , , , and . "Defect identification in (La, Sr)CoO3-δ using positron annihilation spectroscopy." Proceedings of the Materials Research Society Symposium -. Vol. 541. 1999. 161–165.
, , , , , and . "Investigation of vacancy-related defects in (Pb,La)(Zr,Ti)O3 thin films using positron annihilation." IEEE International Symposium on Applications of Ferroelectrics. IEEE, Piscataway, NJ, United States, 1998. 147–150.
, , , , , , and . "Imprint in ferroelectric capacitors." Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 35 (1996) 1521–1524.
, , , , , , , and . "La0.5Sr0.5CoO3 electrode technology for Pb(Zr,Ti)O3 thin film nonvolatile memories." Microelectronic Engineering 29 (1995) 223–230.
Google Scholar | DOI | BibTeX | Endnote tagged | RIS
, , , , and . "Periodic Giant Polarization Gradients in Doped BiFeO3 Thin Films." Nano Letters 18 (2018) 717–724.
Google Scholar | DOI | BibTeX | Endnote tagged | RIS
, , , , , and . "An epitaxial transparent conducting perovskite oxide: Double-doped SrTiO3." Chemistry of Materials 22 (2010) 3983–3987.
Google Scholar | DOI | BibTeX | Endnote tagged | RIS
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