D.J Keeble
Publications
Viewing 11 of 11 publications
2000
Oxygen deficiency and vacancy formation in LSCO/PLZT/LSCO capacitors." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 393–397.
, , , , , , and . "Vacancy formation in (Pb,La)(Zr,Ti)O3 capacitors with oxygen deficiency and the effect on voltage offset." Applied Physics Letters 77 (2000) 127–129.
, , , , , and . "A study of vacancy-related defects in (pb,la)(zr,ti)o3 thin films using positron annihilation." IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 47 (2000) 916–920.
, , , , , and . "1999
Defect identification in (La, Sr)CoO3-δ using positron annihilation spectroscopy." Materials Research Society Symposium - Proceedings. Vol. 541. 1999. 161–165.
, , , , , , , , , and . "Infrared absorbing oxide electrodes in epitaxial pyroelectric Pb-La-Ti-O heterostructures with controlled domain orientation." Integrated Ferroelectrics 25 (1999) 135–147.
, , , , , , , , , and . "1998
Investigation of vacancy-related defects in (Pb,La)(Zr,Ti)O3 thin films using positron annihilation." IEEE International Symposium on Applications of Ferroelectrics. IEEE, Piscataway, NJ, United States, 1998. 147–150.
, , , , , and . "Vacancy defects in (Pb, La)(Zr, Ti)O3 capacitors observed by positron annihilation." Applied Physics Letters 73 (1998) 318–320.
, , , , , , and . "Vacancy defects in thin-film La0.5Sr0.5CoO3-δ observed by positron annihilation." Applied Physics Letters 73 (1998) 508–510.
, , , , , , , and . "1997
Vacancy related defects in La0.5Sr0.5CoO3-δ thin films." Materials Research Society Symposium - Proceedings. Vol. 477. MRS, Warrendale, PA, United States, 1997. 229–233.
, , , , , , , and . "1995
Vacancy related defects in thin film Pb(ZrTi)O3 materials." Materials Research Society Symposium - Proceedings. Vol. 361. Materials Research Society, Pittsburgh, PA, United States, 1995. 129–134.
, , , , , , , and . "Positron annihilation studies of vacancy related defects in ceramic and thin film pb(zr,ti)o3 materials." Integrated Ferroelectrics 8 (1995) 121–128.
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