TY - JOUR
AU - D.J Keeble
AU - A Krishnan
AU - M.T Umlor
AU - K.G Lynn
AU - W.L Warren
AU - D Dimos
AU - B.A Tuttle
AU - Ramamoorthy Ramesh
AU - E.H Poindexter
AB - Preliminary positron annihilation studies of ceramic and thin film Pb(Zr,Ti)O3 (PZT) materials have been completed. The aim of this work was to examine the effects of processing conditions on vacancy related defects. Positron lifetime measurements on bulk PLZT plates showed an increase in positron trapping to a defect state with increasing grain size consistent with trapping to lead vacancy related defects formed through lead oxide loss during processing. Variable energy positron beam measurements were completed on bulk PLZT plates, sol-gel PZT thin films and laser ablated PLZT thin films. Films processed in a reduced oxygen atmosphere were found to give a higher S-parameter, due to an increase in concentration of neutral or negatively charged vacancy type defects, compared with material processed in an oxidizing ambient. © 1995, Taylor & Francis Group, LLC. All rights reserved.
BT - Integrated Ferroelectrics
DO - 10.1080/10584589508012306
LA - eng
M1 - 1-2
N1 - cited By 7
N2 - Preliminary positron annihilation studies of ceramic and thin film Pb(Zr,Ti)O3 (PZT) materials have been completed. The aim of this work was to examine the effects of processing conditions on vacancy related defects. Positron lifetime measurements on bulk PLZT plates showed an increase in positron trapping to a defect state with increasing grain size consistent with trapping to lead vacancy related defects formed through lead oxide loss during processing. Variable energy positron beam measurements were completed on bulk PLZT plates, sol-gel PZT thin films and laser ablated PLZT thin films. Films processed in a reduced oxygen atmosphere were found to give a higher S-parameter, due to an increase in concentration of neutral or negatively charged vacancy type defects, compared with material processed in an oxidizing ambient. © 1995, Taylor & Francis Group, LLC. All rights reserved.
PY - 1995
SP - 121
EP - 128
T2 - Integrated Ferroelectrics
TI - Positron annihilation studies of vacancy related defects in ceramic and thin film pb(zr,ti)o3 materials
VL - 8
SN - 10584587
ER -