X ray photoelectron spectroscopy

Schrott, A.G, J.A Misewich, V Nagarajan, and Ramamoorthy Ramesh. "Ferroelectric field-effect transistor with a SrRuxTi1-xO3 channel." Applied Physics Letters 82 (2003) 4770–4772.

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Auciello, O, A.M Dhote, Ramamoorthy Ramesh, B.T Liu, S Aggarwal, A.H Mueller, N.A Suvarova, and E.A Irene. "Development of materials integration strategies for electroceramic film-based devices via complementary in situ and ex situ studies of film growth and interface processes." Integrated Ferroelectrics. Vol. 46. 2002. 295–306.

Chalamala, B.R, R.H Reuss, Y Wei, J.M Bernhard, E.D Sosa, D.E Golden, S Aggarwal, and Ramamoorthy Ramesh. "Oxidation of molybdenum thin films and its impact on molybdenum field emitter arrays." Materials Research Society Symposium Proceedings. Vol. 685. 2001. 353–358.

Krauss, A.R, O Auciello, A.M Dhote, J Im, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Y Gao, and A.H Mueller. "Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties." Integrated Ferroelectrics 32 (2001) 121–131.

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Aggarwal, S, B Nagaraj, I.G Jenkins, H Li, R.P Sharma, L Salamanca-Riba, Ramamoorthy Ramesh, A.M Dhote, A.R Krauss, and O Auciello. "Correlation between oxidation resistance and crystallinity of Ti-Al as a barrier layer for high-density memories." Acta Materialia 48 (2000) 3387–3394.

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Bernhard, J.M, A Rouse, E.D Sosa, D.E Golden, B.R Chalamala, S Aggarwal, B.E Gnade, and Ramamoorthy Ramesh. "Photoelectric workfunctions of metals oxide films and emission characteristics of molybdenum emitter tips with oxide coatings." Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC. IEEE, Piscataway, NJ, United States, 1998. 32–33.

Chang, C.C, T Venkatesan, M.S Hegde, D.M Hwang, Ramamoorthy Ramesh, C.T Rogers, A Frenkel, E.W Chase, L Nazar, X.D Wu, and A Inam. "Electron microscopy and spectroscopy for characterization of surface and film properties of high temperature superconductors." Proceedings of SPIE - The International Society for Optical Engineering 1187 (1990) 216–226.

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