Reliability

Ramesh, Ramamoorthy, T Sands, V.G Keramidas, D.K Fork, Tuttle Bruce A, Desu Seshu B, and Larsen Poul K. "Ferroelectric La-Sr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon: reliability testing." Materials Research Society Symposium - Proceedings. Ed. Myers R. Vol. 310. Publ by Materials Research Society, Pittsburgh, PA, United States, 1993. 195–200.

Steffes, J.J, R.A Ristau, Ramamoorthy Ramesh, and B.D Huey. "Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy." Proceedings of the National Academy of Sciences of the United States of America 116 (2019) 2413–2418.

Google Scholar | DOI | BibTeX | Endnote tagged

Dhote, A.M, S Madhukar, D Young, T Venkatesan, Ramamoorthy Ramesh, C.M Cotell, and J.M Benedetto. "Low temperature growth and reliability of ferroelectric memory cell integrated on Si with conducting barrier stack." Journal of Materials Research 12 (1997) 1589–1594.

Google Scholar | DOI | BibTeX | Endnote tagged

Wei, W, A.M Dhote, Ramamoorthy Ramesh, and S Sauvage. "Reliability studies of polycrystalline La-Sr-Co-O/Pb-La-Zr-Ti-O/La-Sr-Co-O capacitors on silicon." Integrated Ferroelectrics 12 (1996) 53–62.

Google Scholar | DOI | BibTeX | Endnote tagged

Gómez, Tomás, Chris Marnay, Afzal S Siddiqui, Lucy Liew, and Mark Khavkin. Ancillary Services Markets in California. Berkeley: Lawrence Berkeley National Laboratory, 1999.