Reliability

Ramesh, Ramamoorthy, T Sands, V.G Keramidas, D.K Fork, Tuttle Bruce A, Desu Seshu B, and Larsen Poul K. "Ferroelectric La-Sr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon: reliability testing." Materials Research Society Symposium - Proceedings. Ed. Myers R. Vol. 310. Publ by Materials Research Society, Pittsburgh, PA, United States, 1993. 195–200.

Steffes, J.J, R.A Ristau, Ramamoorthy Ramesh, and B.D Huey. "Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy." Proceedings of the National Academy of Sciences of the United States of America 116 (2019) 2413–2418.

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Dhote, A.M, S Madhukar, D Young, T Venkatesan, Ramamoorthy Ramesh, C.M Cotell, and J.M Benedetto. "Low temperature growth and reliability of ferroelectric memory cell integrated on Si with conducting barrier stack." Journal of Materials Research 12 (1997) 1589–1594.

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Wei, W, A.M Dhote, Ramamoorthy Ramesh, and S Sauvage. "Reliability studies of polycrystalline La-Sr-Co-O/Pb-La-Zr-Ti-O/La-Sr-Co-O capacitors on silicon." Integrated Ferroelectrics 12 (1996) 53–62.

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Gómez, Tomás, Chris Marnay, Afzal S Siddiqui, Lucy Liew, and Mark Khavkin. Ancillary Services Markets in California. Berkeley: Lawrence Berkeley National Laboratory, 1999.