J.J Steffes

Publications

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2019

Steffes, J.J, R.A Ristau, Ramamoorthy Ramesh, and B.D Huey. "Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy." Proceedings of the National Academy of Sciences of the United States of America 116 (2019) 2413–2418.

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