%0 Journal Article
%K Reliability
%K Tomography
%K Transmission electron microscopy
%K Room temperature
%K Thickness
%K Atomic force microscopy
%K Polarization
%K Article
%K Controlled study
%A J.J Steffes
%A R.A Ristau
%A Ramamoorthy Ramesh
%A B.D Huey
%B Proceedings of the National Academy of Sciences of the United States of America
%D 2019
%G eng
%I National Academy of Sciences
%P 2413-2418
%R 10.1073/pnas.1806074116
%T Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy
%V 116