Scanning force microscopy (SFM)

Gruverman, A, S.A Prakash, S Aggarwal, Ramamoorthy Ramesh, O Auciello, and H Tokumoto. "Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Materials Research Society Symposium - Proceedings. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53–58.

Auciello, O, A Gruverman, H Tokumoto, S.A Prakash, S Aggarwal, and Ramamoorthy Ramesh. "Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films." MRS Bulletin 23 (1998) 33–41.

Nagarajan, V, C.S Ganpule, A Roytburd, and Ramamoorthy Ramesh. "Nanoscale phenomena in ferroelectric thin films." Integrated Ferroelectrics. Vol. 42. 2002. 173–189.

Nagarajan, V, A Stanishevsky, L Chen, T Zhao, B.-T Liu, J Melngailis, A.L Roytburd, Ramamoorthy Ramesh, J Finder, Z Yu, R Droopad, and K Eisenbeiser. "Realizing intrinsic piezoresponse in epitaxial submicron lead zirconate titanate capacitors on Si." Applied Physics Letters 81 (2002) 4215–4217.

Ganpule, C.S, A.L Roytburd, V Nagarajan, B.K Hill, S.B Ogale, E.D Williams, Ramamoorthy Ramesh, and J.F Scott. "Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films." Physical Review B - Condensed Matter and Materials Physics 65 (2002) 141011–141017.

Auciello, O, A.R Krauss, I.M Jaemo, A Dhote, D.M Gruen, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Y Gao, and A.H Mueller. "Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 103–118.