TY - JOUR
KW - Microstructure
KW - Thin films
KW - Polarization
KW - Ferroelectric materials
KW - Piezoelectricity
KW - Surface properties
KW - Ferroelectric thin films
KW - Microscopic examination
KW - Scanning force microscopy (SFM)
KW - Dielectric films
AU - O Auciello
AU - A Gruverman
AU - H Tokumoto
AU - S.A Prakash
AU - S Aggarwal
AU - Ramamoorthy Ramesh
BT - MRS Bulletin
LA - eng
M1 - 1
N1 - cited By 82
PY - 1998
SP - 33
EP - 41
T2 - MRS Bulletin
TI - Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films
VL - 23
SN - 08837694
ER -