H Tokumoto

Gruverman, A, S.A Prakash, S Aggarwal, Ramamoorthy Ramesh, O Auciello, and H Tokumoto. "Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy." Proceedings of the Materials Research Society Symposium -. Vol. 493. MRS, Warrendale, PA, United States, 1998. 53–58.

Auciello, O, A Gruverman, H Tokumoto, S.A Prakash, S Aggarwal, and Ramamoorthy Ramesh. "Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films." MRS Bulletin 23 (1998) 33–41.

Gruverman, A, H Tokumoto, A.S Prakash, S Aggarwal, B Yang, M Wuttig, Ramamoorthy Ramesh, O Auciello, and T Venkatesan. "Nanoscale imaging of domain dynamics and retention in ferroelectric thin films." Applied Physics Letters 71 (1997) 3492–3494.

Gruverman, A, O Auciello, Ramamoorthy Ramesh, and H Tokumoto. "Scanning force microscopy of domain structure in ferroelectric thin films: Imaging and control." Nanotechnology 8 (1997) A38-A43.