TY - JOUR
KW - Atomic force microscopy
KW - Polarization
KW - Ferroelectric materials
KW - Imaging techniques
KW - Polarization reversal
KW - Polycrystalline materials
KW - Dielectric films
KW - Random walk process
AU - A Gruverman
AU - H Tokumoto
AU - A.S Prakash
AU - S Aggarwal
AU - B Yang
AU - M Wuttig
AU - Ramamoorthy Ramesh
AU - O Auciello
AU - T Venkatesan
AB - We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization. © 1997 American Institute of Physics.
BT - Applied Physics Letters
DO - 10.1063/1.120369
LA - eng
M1 - 24
N1 - cited By 187
N2 - We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization. © 1997 American Institute of Physics.
PB - American Institute of Physics Inc.
PY - 1997
SP - 3492
EP - 3494
T2 - Applied Physics Letters
TI - Nanoscale imaging of domain dynamics and retention in ferroelectric thin films
VL - 71
SN - 00036951
ER -