@article{33853,
  keywords = {Microstructure, Thin films, Polarization, Ferroelectric materials, Piezoelectricity, Surface properties, Ferroelectric thin films, Microscopic examination, Scanning force microscopy (SFM), Dielectric films},
  author = {O Auciello and A Gruverman and H Tokumoto and S.A Prakash and S Aggarwal and Ramamoorthy Ramesh},
  title = {Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films},
  year = {1998},
  journal = {MRS Bulletin},
  volume = {23},
  number = {1},
  pages = {33-41},
  issn = {08837694},
  note = {cited By 82},
  language = {eng},
}