Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

Publication Type	Journal Article

Authors	O Auciello A Gruverman H Tokumoto S.A Prakash S Aggarwal Ramamoorthy Ramesh
Notes	cited By 82
Journal	MRS Bulletin
Volume	23
Year of Publication	1998
Number	1
Pagination	33-41
ISSN Number	08837694
Keywords	Microstructure Thin films Polarization Ferroelectric materials Piezoelectricity Surface properties Ferroelectric thin films Microscopic examination Scanning force microscopy (SFM) Dielectric films
Research Areas	Ramesh Lab
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