@article{33861,
  keywords = {Atomic force microscopy, Polarization, Ferroelectric materials, Imaging techniques, Polarization reversal, Polycrystalline materials, Dielectric films, Random walk process},
  author = {A Gruverman and H Tokumoto and A.S Prakash and S Aggarwal and B Yang and M Wuttig and Ramamoorthy Ramesh and O Auciello and T Venkatesan},
  title = {Nanoscale imaging of domain dynamics and retention in ferroelectric thin films},
  abstract = {We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization. © 1997 American Institute of Physics.},
  year = {1997},
  journal = {Applied Physics Letters},
  volume = {71},
  number = {24},
  pages = {3492-3494},
  publisher = {American Institute of Physics Inc.},
  issn = {00036951},
  doi = {10.1063/1.120369},
  note = {cited By 187},
  language = {eng},
}