Recoil spectroscopy

Auciello, O, A.M Dhote, Ramamoorthy Ramesh, B.T Liu, S Aggarwal, A.H Mueller, N.A Suvarova, and E.A Irene. "Development of materials integration strategies for electroceramic film-based devices via complementary in situ and ex situ studies of film growth and interface processes." Integrated Ferroelectrics. Vol. 46. 2002. 295–306.

Krauss, A.R, O Auciello, A.M Dhote, J Im, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Yuan Gao, and A.H Mueller. "Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties." Integrated Ferroelectrics 32 (2001) 121–131.

Auciello, O, A.R Krauss, J Im, A Dhote, D.M Gruen, E.A Irene, Yuan Gao, A.H Mueller, and Ramamoorthy Ramesh. "Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques." Integrated Ferroelectrics 28 (2000) 1–12.

Auciello, O, A.R Krauss, I.M Jaemo, A Dhote, D.M Gruen, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Yuan Gao, and A.H Mueller. "Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 103–118.