Ellipsometry

Krauss, A.R, O Auciello, A.M Dhote, J Im, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Yuan Gao, and A.H Mueller. "Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties." Integrated Ferroelectrics 32 (2001) 121–131.

Auciello, O, A.R Krauss, J Im, A Dhote, D.M Gruen, E.A Irene, Yuan Gao, A.H Mueller, and Ramamoorthy Ramesh. "Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques." Integrated Ferroelectrics 28 (2000) 1–12.

Auciello, O, A.R Krauss, I.M Jaemo, A Dhote, D.M Gruen, S Aggarwal, Ramamoorthy Ramesh, E.A Irene, Yuan Gao, and A.H Mueller. "Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 103–118.