X-ray diffraction studies

Wang, Y, C Ganpule, B.T Liu, H Li, K Mori, B Hill, M Wuttig, Ramamoorthy Ramesh, J Finder, Z Yu, R Droopad, and K Eisenbeiser. "Epitaxial ferroelectric Pb(Zr,Ti)O3 thin films on Si using SrTiO3 template layers." Applied Physics Letters 80 (2002) 97–99.

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