@article{33717,
  keywords = {Lead, Perovskite, Zirconium, Cobalt compounds, Epitaxial growth, Ferroelectricity, Strontium titanates, X-ray Diffraction, Strontium alloys, Remnant polarizations, Epitaxial ferroelectric, SrTiO, Epitaxial films, In-plane, Semiconducting silicon compounds, PZT, Template layers, Pb(Zr, Ti)O, Out-of-plane, Polycrystalline film, X-ray diffraction studies},
  author = {Y Wang and C Ganpule and B.T Liu and H Li and K Mori and B Hill and M Wuttig and Ramamoorthy Ramesh and J Finder and Z Yu and R Droopad and K Eisenbeiser},
  title = {Epitaxial ferroelectric Pb(Zr,Ti)O3 thin films on Si using SrTiO3 template layers},
  abstract = {In this letter, we report on the integration of epitaxial ferroelectric Pb(Zr,Ti)O3 (PZT) thin films on Si [100] substrates using a SrTiO3 (STO) template layer and a conducting perovskite (La 0.5Sr0.5)CoO3 electrode. X-ray diffraction studies reveal both in-plane and out-of-plane alignment of the heterostructure. The epitaxial films show extremely high remnant polarization as well as piezoelectric d33 coefficients compared to textured and untextured polycrystalline films. © 2002 American Institute of Physics.},
  year = {2002},
  journal = {Applied Physics Letters},
  volume = {80},
  number = {1},
  pages = {97-99},
  issn = {00036951},
  doi = {10.1063/1.1428413},
  note = {cited By 126},
  language = {eng},
}