Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

Publication Type	Journal Article

Authors	O Auciello A Gruverman H Tokumoto S.A Prakash S Aggarwal Ramamoorthy Ramesh
Notes	cited By 82
Journal	MRS Bulletin
Volume	23
Year of Publication	1998
Number	1
Pagination	33-41
ISSN Number	08837694
Keywords	Microstructure Thin films Polarization Ferroelectric materials Piezoelectricity Surface properties Ferroelectric thin films Microscopic examination Scanning force microscopy (SFM) Dielectric films
Organizations	No Organization
Research Areas	Ramesh Lab
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