Size effects in ultrathin epitaxial ferroelectric heterostructures
Publication Type | Journal Article
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Authors | |
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DOI |
10.1063/1.1765742
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Abstract |
The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.
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Notes |
cited By 92
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Journal |
Applied Physics Letters
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Volume |
84
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Year of Publication |
2004
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Number |
25
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Pagination |
5225-5227
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ISSN Number |
00036951
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Keywords |
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Research Areas | |
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