@article{33668,
  keywords = {pulsed laser deposition, transmission electron microscopy, Perovskite, lattice constants, electrodes, Ferroelectric materials, Epitaxial growth, Heterojunctions, Capacitors, Compressive strain, Thick films, Electrostatics, Ultrathin films, Lattice mismatch, Pulsed polarization, Switched polarization, Cathode ray oscilloscopes, Photoresists, Superconducting transition temperature},
  author = {V Nagarajan and S Prasertchoung and T Zhao and H Zheng and J Ouyang and Ramamoorthy Ramesh and W Tian and X.Q Pan and D.M Kim and C.B Eom and H Kohlstedt and R Waser},
  title = {Size effects in ultrathin epitaxial ferroelectric heterostructures},
  abstract = {The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.},
  year = {2004},
  journal = {Applied Physics Letters},
  volume = {84},
  number = {25},
  pages = {5225-5227},
  issn = {00036951},
  doi = {10.1063/1.1765742},
  note = {cited By 92},
  language = {eng},
}