%0 Journal Article
%K Pulsed laser deposition
%K Transmission electron microscopy
%K Perovskite
%K Lattice constants
%K Electrodes
%K Ferroelectric materials
%K Epitaxial growth
%K Heterojunctions
%K Capacitors
%K Compressive strain
%K Thick films
%K Electrostatics
%K Ultrathin films
%K Lattice mismatch
%K Pulsed polarization
%K Switched polarization
%K Cathode ray oscilloscopes
%K Photoresists
%K Superconducting transition temperature
%A V Nagarajan
%A S Prasertchoung
%A T Zhao
%A H Zheng
%A J Ouyang
%A Ramamoorthy Ramesh
%A W Tian
%A X.Q Pan
%A D.M Kim
%A C.B Eom
%A H Kohlstedt
%A R Waser
%B Applied Physics Letters
%D 2004
%G eng
%P 5225-5227
%R 10.1063/1.1765742
%T Size effects in ultrathin epitaxial ferroelectric heterostructures
%V 84
%X The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.