TY - JOUR
KW - Pulsed laser deposition
KW - Transmission electron microscopy
KW - Perovskite
KW - Lattice constants
KW - Electrodes
KW - Ferroelectric materials
KW - Epitaxial growth
KW - Heterojunctions
KW - Capacitors
KW - Compressive strain
KW - Thick films
KW - Electrostatics
KW - Ultrathin films
KW - Lattice mismatch
KW - Pulsed polarization
KW - Switched polarization
KW - Cathode ray oscilloscopes
KW - Photoresists
KW - Superconducting transition temperature
AU - V Nagarajan
AU - S Prasertchoung
AU - T Zhao
AU - H Zheng
AU - J Ouyang
AU - Ramamoorthy Ramesh
AU - W Tian
AU - X.Q Pan
AU - D.M Kim
AU - C.B Eom
AU - H Kohlstedt
AU - R Waser
AB - The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.
BT - Applied Physics Letters
DO - 10.1063/1.1765742
LA - eng
M1 - 25
N1 - cited By 92
N2 - The thickness scaling effect in PbZr 0.2Ti 0.8O 3 heterostructures was investigated. A systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick was also shown. The experiment was focused on the PZT composition since it had an in-plane lattice parameter. A preliminary model based on a modified Landau Ginzburg approach suggested that the nature of the electrostatics at the ferroelectric-electrode interface played a significant role in the scaling of ferroelectric thin films.
PY - 2004
SP - 5225
EP - 5227
T2 - Applied Physics Letters
TI - Size effects in ultrathin epitaxial ferroelectric heterostructures
VL - 84
SN - 00036951
ER -