Microstructure of epitaxial oxide thin film heterostructures on silicon by pulsed laser deposition

Publication Type
Journal Article
Authors
DOI
10.1063/1.111293
Abstract
The microstructure of epitaxial La0.5Sr0.5CoO 3(LSCO)/ferroelectric lanthanum modified lead zirconate titanate (PLZT)/ La0.5Sr0.5CoO3(LSCO)/bismuth titanate(BT)/yttria-stabilized zirconia (YSZ) heterostructures on [001] silicon has been investigated. X-ray diffraction and pole figure analysis reveal epitaxial growth of the PLZT, LSCO, BT, and YSZ layers. High resolution transmission electron microscopy was done to study the crystal defects and interfacial structure.
Notes
cited By 15
Journal
Applied Physics Letters
Volume
64
Year of Publication
1994
Number
25
Pagination
3407-3409
ISSN Number
00036951
Keywords
Research Areas
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