TY - JOUR
KW - Deposition
KW - Microstructure
KW - Thin films
KW - Pulsed laser deposition
KW - Transmission electron microscopy
KW - Yttria stabilized zirconia
KW - Zirconia
KW - Lanthanum compounds
KW - Epitaxial growth
KW - Bismuth compounds
KW - X-ray Diffraction
KW - Heterojunctions
KW - Lead compounds
KW - Crystal defects
KW - Semiconducting silicon
KW - Lanthanum strontium cobalt oxide
KW - X-ray Analysis
KW - Bismuth titanate
KW - Lanthanum modified lead zirconate titanate
KW - Pole figure analysis
KW - Thin film heterostructures
AU - S.G Ghonge
AU - E Goo
AU - Ramamoorthy Ramesh
AU - R Haakenaasen
AU - D.K Fork
AB - The microstructure of epitaxial La0.5Sr0.5CoO 3(LSCO)/ferroelectric lanthanum modified lead zirconate titanate (PLZT)/ La0.5Sr0.5CoO3(LSCO)/bismuth titanate(BT)/yttria-stabilized zirconia (YSZ) heterostructures on [001] silicon has been investigated. X-ray diffraction and pole figure analysis reveal epitaxial growth of the PLZT, LSCO, BT, and YSZ layers. High resolution transmission electron microscopy was done to study the crystal defects and interfacial structure.
BT - Applied Physics Letters
DO - 10.1063/1.111293
LA - eng
M1 - 25
N1 - cited By 15
N2 - The microstructure of epitaxial La0.5Sr0.5CoO 3(LSCO)/ferroelectric lanthanum modified lead zirconate titanate (PLZT)/ La0.5Sr0.5CoO3(LSCO)/bismuth titanate(BT)/yttria-stabilized zirconia (YSZ) heterostructures on [001] silicon has been investigated. X-ray diffraction and pole figure analysis reveal epitaxial growth of the PLZT, LSCO, BT, and YSZ layers. High resolution transmission electron microscopy was done to study the crystal defects and interfacial structure.
PY - 1994
SP - 3407
EP - 3409
T2 - Applied Physics Letters
TI - Microstructure of epitaxial oxide thin film heterostructures on silicon by pulsed laser deposition
VL - 64
SN - 00036951
ER -