Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
| Publication Type | Conference Paper
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| Abstract |
Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.
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| Notes |
cited By 7
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| Conference Name |
IEEE International Symposium on Applications of Ferroelectrics
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| Year of Publication |
1994
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| Pagination |
66-69
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| Publisher |
IEEE, Piscataway, NJ, United States
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