TY - CPAPER
KW - Measurements
KW - Thin films
KW - Oxides
KW - Electrodes
KW - Stresses
KW - Polarization
KW - Ferroelectric materials
KW - Lead compounds
KW - Capacitors
KW - Thermal effects
KW - Lanthanum strontium cobalt oxide
KW - Ferroelectric imprint
KW - Lead lanthanum zirconate titanate
KW - Voltage stress
AU - J.M Benedetto
AU - M.L Roush
AU - I.K Lloyd
AU - Ramamoorthy Ramesh
AU - Anon Anon
AB - Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.
BT - IEEE International Symposium on Applications of Ferroelectrics
LA - eng
N1 - cited By 7
N2 - Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.
PB - IEEE, Piscataway, NJ, United States
PY - 1994
SP - 66
EP - 69
T2 - IEEE International Symposium on Applications of Ferroelectrics
T3 - IEEE International Symposium on Applications of Ferroelectrics
TI - Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
ER -