%0 Conference Paper
%K Measurements
%K Thin films
%K Oxides
%K Electrodes
%K Stresses
%K Polarization
%K Ferroelectric materials
%K Lead compounds
%K Capacitors
%K Thermal effects
%K Lanthanum strontium cobalt oxide
%K Ferroelectric imprint
%K Lead lanthanum zirconate titanate
%K Voltage stress
%A J.M Benedetto
%A M.L Roush
%A I.K Lloyd
%A Ramamoorthy Ramesh
%A Anon Anon
%B IEEE International Symposium on Applications of Ferroelectrics
%D 1994
%G eng
%I IEEE, Piscataway, NJ, United States
%P 66-69
%T Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
%X Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.