@inproceedings{33931,
  keywords = {Measurements, Thin films, Oxides, Electrodes, Stresses, Polarization, Ferroelectric materials, Lead compounds, Capacitors, Thermal effects, Lanthanum strontium cobalt oxide, Ferroelectric imprint, Lead lanthanum zirconate titanate, Voltage stress},
  author = {J.M Benedetto and M.L Roush and I.K Lloyd and Ramamoorthy Ramesh},
  editor = {Anon Anon},
  title = {Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes},
  abstract = {Ferroelectric imprint is measured on thin-film PLZT. capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.},
  year = {1994},
  journal = {IEEE International Symposium on Applications of Ferroelectrics},
  pages = {66-69},
  publisher = {IEEE, Piscataway, NJ, United States},
  note = {cited By 7},
  language = {eng},
}