Diagnostics of "colossal" magnetoresistance manganite films by Raman spectroscopy
Publication Type | Journal Article
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Authors | |
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DOI |
10.1063/1.122723
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Abstract |
Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1-xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of "as-grown" films compared to those annealed in oxygen at 800°C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found. © 1998 American Institute of Physics.
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Notes |
cited By 45
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Journal |
Applied Physics Letters
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Volume |
73
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Year of Publication |
1998
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Number |
22
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Pagination |
3217-3219
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ISSN Number |
00036951
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Keywords | |
Research Areas | |
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