@article{33828,
  keywords = {Thin films, Annealing, Raman scattering, Laser ablation, Magnetoresistance, Substrates, Oxygen, Raman spectroscopy, Phonons, Magnetization, Temperature dependence, Magnetoresistance manganite films},
  author = {V.B Podobedov and D.B Romero and A Weber and J.P Rice and R Schreekala and M Rajeswari and Ramamoorthy Ramesh and T Venkatesan and H.D Drew},
  title = {Diagnostics of "colossal" magnetoresistance manganite films by Raman spectroscopy},
  abstract = {Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1-xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of "as-grown" films compared to those annealed in oxygen at 800°C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found. © 1998 American Institute of Physics.},
  year = {1998},
  journal = {Applied Physics Letters},
  volume = {73},
  number = {22},
  pages = {3217-3219},
  issn = {00036951},
  doi = {10.1063/1.122723},
  note = {cited By 45},
  language = {eng},
}